The paper studies the convergence behavior of Monte Carlo schemes for semiconductors. A detailed analysis of the systematic error with respect to numerical parameters is performed. Different sources of systematic error are pointed out and illustrated in a spatially one-dimensional test case. The error with respect to the number of simulation particles occurs during the calculation of the internal electric field. The time step error, which is related to the splitting of transport and electric field calculations, vanishes sufficiently fast. The error due to the approximation of the trajectories of particles depends on the ODE solver used in the algorithm. It is negligible compared to the other sources of time step error, when a second order Runge-Kutta solver is used. The error related to the approximate scattering mechanism is the most significant source of error with respect to the time step.
Mots clés : Boltzmann-Poisson equations, electronic devices, Monte Carlo simulations
@article{M2AN_2010__44_5_1049_0,
author = {Muscato, Orazio and Wagner, Wolfgang and Di Stefano, Vincenza},
title = {Numerical study of the systematic error in {Monte} {Carlo} schemes for semiconductors},
journal = {ESAIM: Mod\'elisation math\'ematique et analyse num\'erique},
pages = {1049--1068},
publisher = {EDP-Sciences},
volume = {44},
number = {5},
year = {2010},
doi = {10.1051/m2an/2010051},
mrnumber = {2731402},
zbl = {1198.82068},
language = {en},
url = {http://www.numdam.org/articles/10.1051/m2an/2010051/}
}
TY - JOUR AU - Muscato, Orazio AU - Wagner, Wolfgang AU - Di Stefano, Vincenza TI - Numerical study of the systematic error in Monte Carlo schemes for semiconductors JO - ESAIM: Modélisation mathématique et analyse numérique PY - 2010 SP - 1049 EP - 1068 VL - 44 IS - 5 PB - EDP-Sciences UR - http://www.numdam.org/articles/10.1051/m2an/2010051/ DO - 10.1051/m2an/2010051 LA - en ID - M2AN_2010__44_5_1049_0 ER -
%0 Journal Article %A Muscato, Orazio %A Wagner, Wolfgang %A Di Stefano, Vincenza %T Numerical study of the systematic error in Monte Carlo schemes for semiconductors %J ESAIM: Modélisation mathématique et analyse numérique %D 2010 %P 1049-1068 %V 44 %N 5 %I EDP-Sciences %U http://www.numdam.org/articles/10.1051/m2an/2010051/ %R 10.1051/m2an/2010051 %G en %F M2AN_2010__44_5_1049_0
Muscato, Orazio; Wagner, Wolfgang; Di Stefano, Vincenza. Numerical study of the systematic error in Monte Carlo schemes for semiconductors. ESAIM: Modélisation mathématique et analyse numérique, Tome 44 (2010) no. 5, pp. 1049-1068. doi : 10.1051/m2an/2010051. http://www.numdam.org/articles/10.1051/m2an/2010051/
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